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SyncMOS Technologies Inc. S29C51001T/S29C51001B 1 MEGABIT (131,072 x 8 BIT) 5 VOLT CMOS FLASH MEMORY Features s s s s s s 128Kx8-bit Organization Address Access Time: 70, 90, 120 ns Single 5V 10% Power Supply Sector Erase Mode Operation 8KB Boot Block (lockable) 512 bytes per Sector, 256 Sectors - Sector-Erase Cycle Time: 10ms (Max) - Byte-Program Cycle Time: 20s (Max) Minimum 10,000 Erase-Program Cycles Low power dissipation - Active Read Current: 20mA (Typ) - Active Program Current: 30mA (Typ) - Standby Current: 100A (Max) Hardware Data Protection Low VCC Program Inhibit Below 3.2V Self-timed program/erase operations with endof-cycle detection - DATA Polling - Toggle Bit CMOS and TTL Interface Available in two versions - S29C51001T (Top Boot Block) - S29C51001B (Bottom Boot Block) Packages: - 32-pin Plastic DIP - 32-pin TSOP-I - 32-pin PLCC Description The S29C51001T/S29C51001B is a high speed 131,072 x 8 bit CMOS flash memory. Programming or erasing the device is done with a single 5 Volt power supply. The device has separate chip enable CE, program enable WE, and output enable OE controls to eliminate bus contention. The S29C51001T/S29C51001B offers a combination of features: Boot Block with Sector Erase Mode. The end of program/erase cycle is detected by DATA Polling of I/O7 or by the Toggle Bit I/O6. The S29C51001T/S29C51001B features a sector erase operation which allows each sector to be erased and reprogrammed without affecting data stored in other sectors. The device also supports full chip erase. Boot block architecture enables the device to boot from a protected sector loaded either at the top (S29C51001T) or the bottom (S29C51001B) sector. All inputs and outputs are CMOS and TTL compatible. The S29C51001T/S29C51001B is ideal for applications that require updatable code and data storage. s s s s s s s s S29C51001T/S29C51001B V1.0 February 2003 1 SyncMOS Technologies Inc. S29C51001T/S29C51001B 1 MEGABIT (131,072 x 8 BIT) 5 VOLT CMOS FLASH MEMORY S 29 C 51 001 T - OPERATING VOLTAGE 51: 5V DEVICE SPEED P = PDIP T = TSOP-I J = PLCC PKG. BOOT BLOCK LOCATION T: TOP 70: 70ns 90: 90ns 12: 120ns Pin Configurations N/C A16 A15 A12 A7 A6 A5 A4 A3 A2 A1 A0 I/O0 I/O1 I/O2 GND 1 2 3 4 5 6 7 8 9 10 11 12 13 14 15 16 32 31 30 29 28 27 32-Pin PDIP 26 Top View 25 24 23 22 21 20 19 18 17 51001-02 Pin Names VCC WE NC A14 A13 A8 A9 A11 OE A10 CE I/O7 I/O6 I/O5 I/O4 I/O3 A0-A16 I/O0-I/O7 CE OE WE VCC GND NC Address Inputs Data Input/Output Chip Enable Output Enable Program Enable 5V 10% Power Supply Ground No Connect VCC WE A12 A15 A16 NC NC 4 3 2 1 32 31 30 29 28 27 26 25 24 23 22 21 A7 A6 A5 A4 A3 A2 A1 A0 I/O0 5 6 7 8 9 10 11 12 13 14 15 16 17 18 19 20 A14 A13 A8 A9 A11 OE A10 CE I/O7 32 Pin PLCC Top View A11 A9 A8 A13 A14 NC WE VCC N/C A16 A15 A12 A7 A6 A5 A4 1 2 3 4 5 6 7 8 9 10 11 12 13 14 15 16 32-Pin TSOP I Standard Pinout Top View 32 31 30 29 28 27 26 25 24 23 22 21 20 19 18 17 51001-04 OE A10 CE I/O7 I/O6 I/O5 I/O4 I/O3 GND I/O2 I/O1 I/O0 A0 A1 A2 A3 I/O1 I/O2 I/O3 I/O4 I/O5 GND I/O6 51001-03 S29C51001T/S29C51001B V1.0 February 2003 2 SyncMOS Technologies Inc. S29C51001T/S29C51001B 1 MEGABIT (131,072 x 8 BIT) 5 VOLT CMOS FLASH MEMORY Functional Block Diagram 1,048,576 Bit Memory Cell Array X-Decoder A0-A16 Address buffer & latches Y-Decoder CE OE WE Control Logic I/O Buffer & Data Latches I/O0-I/O7 51001-05 Capacitance (1,2) Symbol CIN COUT CIN2 Parameter Input Capacitance Output Capacitance Control Pin Capacitance Test mSetup VIN = 0 VOUT = 0 VIN = 0 Typ. 6 8 8 Max. 8 12 10 Units pF pF pF NOTE: 1. Capacitance is sampled and not 100% tested. 2. TA = 25C, VCC = 5V 10%, f = 1 MHz. Latch Up Characteristics(1) Parameter Input Voltage with Respect to GND on A9, OE Input Voltage with Respect to GND on I/O, address or control pins VCC Current NOTE: 1. Includes all pins except VCC. Test conditions: VCC = 5V, one pin at a time. Min. -1 -1 -100 Max. +13 VCC + 1 +100 Unit V V mA AC Test Load +5.0 V IN3064 or Equivalent Device Under Test IN3064 or Equivalent CL = 100 pF 6.2 k IN3064 or Equivalent IN3064 or Equivalent 51001-06 2.7 k S29C51001T/S29C51001B V1.0 February 2003 3 SyncMOS Technologies Inc. S29C51001T/S29C51001B 1 MEGABIT (131,072 x 8 BIT) 5 VOLT CMOS FLASH MEMORY Absolute Maximum Ratings(1) Symbol VIN VIN VCC TSTG TOPR IOUT Parameter Input Voltage (input or I/O pins) Input Voltage (A9 pin, OE) Power Supply Voltage Storage Temerpature (Plastic) Operating Temperature Short Circuit Current (2) Commercial -2 to +7 -2 to +13 -0.5 to +5.5 -65 to +125 0 to +70 200 (Max.) Extended -2 to +7 -2 to +13 -0.5 to +5.5 -65 to +150 -40 to + 125 200 (Max.) Unit V V V C C mA NOTE: 1. Stress greater than those listed unders "Absolute Maximum Ratings" may cause permanent damage to the device. This is a stress rating only and functional operation of the device at these or any other conditions above those indicated in the operational sections of this specification is not implied. Exposure to absolute maximum rating conditions for extended periods may affect reliability. 2. No more than one output maybe shorted at a time and not exceeding one second long. DC Electrical Characteristics (over the commercial operating range) Parameter Name VIL VIH IIL IOL VOL VOH ICC1 Parameter Input LOW Voltage Input HIGH Voltage Input Leakage Current Output Leakage Current Output LOW Voltage Output HIGH Voltage Read Current Test Conditions VCC = VCC Min. VCC = VCC Max. VIN = GND to VCC, VCC = VCC Max. VOUT = GND to VCC, VCC = VCC Max. VCC = VCC Min., IOL = 2.1mA VCC = VCC Min, IOH = -400A CE = OE = VIL, WE = VIH, all I/Os open, Address input = VIL/VIH, at f = 1/tRC Min., VCC = VCC Max. CE = WE = VIL, OE = VIH, VCC = VCC Max. CE = OE = WE = VIH, VCC = VCC Max. CE = OE = WE = VCC - 0.3V, VCC = VCC Max. CE = OE = VIL, WE = VIH CE = OE = VIL, WE = VIH, A9 = VH Max. Min. -- 2 -- -- -- 2.4 -- Max. 0.8 -- 1 1 0.4 -- 40 Unit V V A A V V mA ICC2 ISB ISB1 VH IH Program Current TTL Standby Current CMOS Standby Current Device ID Voltage for A9 Device ID Current for A9 -- -- -- 11.5 -- 50 2 100 12.5 50 mA mA A V A S29C51001T/S29C51001B V1.0 February 2003 4 SyncMOS Technologies Inc. S29C51001T/S29C51001B 1 MEGABIT (131,072 x 8 BIT) 5 VOLT CMOS FLASH MEMORY AC Electrical Characteristics (over all temperature ranges) Read Cycle Parameter Name tRC tAA tACS tOE tCLZ tOLZ tDF tOH -70 Parameter Read Cycle Time Address Access Time Chip Enable Access Time Output Enable Access Time CE Low to Output Active OE Low to Output Active Output Enable or Chip Disable to Output in High Z Output Hold from Address Change -90 Max. -- 70 70 35 -- -- 20 -120 Max. -- 90 90 45 -- -- 30 Min. 70 -- -- -- 0 0 0 Min. 90 -- -- -- 0 0 0 Min. -- -- -- -- -- -- -- -- Max. -- -- -- -- -- -- -- -- Unit ns ns ns ns ns ns ns 0 -- 0 -- ns Program (Erase/Program) Cycle Parameter Name tWC tAS tAH tCS tCH tOES tOEH tWP tWPH tDS tDH tWHWH1 tWHWH2 tWHWH3 -70 Parameter Program Cycle Time Address Setup Time Address Hold Time CE Setup Time CE Hold Time OE Setup Time OE High Hold Time WE Pulse Width WE Pulse Width High Data Setup Time Data Hold Time Programming Cycle Sector Erase Cycle Chip Erase Cycle -90 -120 Min. Typ. Max. Min. Typ. Max. Min. Typ. Max. Unit 70 0 45 0 0 0 0 35 35 25 0 -- -- -- -- -- -- -- -- -- -- -- -- -- -- -- -- 3 -- -- -- -- -- -- -- -- -- -- -- 20 10 -- 90 0 45 0 0 0 0 45 38 30 0 -- -- -- -- -- -- -- -- -- -- -- -- -- -- -- -- 3 -- -- -- -- -- -- -- -- -- -- -- 20 10 -- -- -- -- -- -- -- -- -- -- -- -- -- -- -- -- -- -- -- -- -- -- -- -- -- -- -- -- -- -- -- -- -- -- -- -- -- -- -- -- -- -- -- ns ns ns ns ns ns ns ns ns ns ns us ms s S29C51001T/S29C51001B V1.0 February 2003 5 SyncMOS Technologies Inc. S29C51001T/S29C51001B 1 MEGABIT (131,072 x 8 BIT) 5 VOLT CMOS FLASH MEMORY Waveforms of Read Cycle tRC ADDRESS tAA CE tCE tOE OE tOLZ WE tCLZ I/O HIGH-Z tOH VALID DATA OUT tAA VALID DATA OUT HIGH-Z 51001-07 tDF Waveforms of WE Controlled-Program Cycle 3rd bus cycle tWC tAS ADDRESS 5555H tCH CE PA tAH PA(2) tRC OE tOES WE tCS tWPH tDS tDH I/O A0H PD(3) I/O7(1) DOUT tOH 51001-08 tWP tWHWH1 tDF tOE NOTES: 1. I/O7: The output is the complement of the data written to the device. 2. PA: The address of the memory location to be programmed. 3. PD: The data at the byte address to be programmed. S29C51001T/S29C51001B V1.0 February 2003 6 SyncMOS Technologies Inc. S29C51001T/S29C51001B 1 MEGABIT (131,072 x 8 BIT) 5 VOLT CMOS FLASH MEMORY Waveforms of CE Controlled-Program Cycle tWC ADDRESS 5555H PA tAS tAH WE PA(1) tRC OE tWP CE tOES tWPH tDS tDH I/O A0H PD(2) I/O7 DOUT tOH 51001-09 tWHWH1 tDF tOE Waveforms of Erase Cycle(1) tWC ADDRESS 5555H tAS 2AAAH 5555H tAH CE 5555H 2AAAH SA OE tWP WE tCS tDS tDH I/O AAH 55H 80H AAH 55H tWPH 10H for Chip Erase 30H 51001-10 NOTES: 1. PA: The address of the memory location to be programmed. 2. PD: The data at the byte address to be programmed. 3. SA: The sector address for Sector Erase. Address = don't care for Chip Erase. S29C51001T/S29C51001B V1.0 February 2003 7 SyncMOS Technologies Inc. Waveforms of DATA Polling Cycle tCH CE tOE OE tOEH WE tCE tWHWH1 I/O7 I/O7 I/O7 tOH S29C51001T/S29C51001B 1 MEGABIT (131,072 x 8 BIT) 5 VOLT CMOS FLASH MEMORY tDF VALID DATA OUT HIGH-Z I/O0-I/O6 I/O0-I/O6 INVALID VALID DATA OUT HIGH-Z 51001-11 Waveforms of Toggle Bit Cycle CE tOEH WE OE I/O6 51001-12 S29C51001T/S29C51001B V1.0 February 2003 8 SyncMOS Technologies Inc. S29C51001T/S29C51001B 1 MEGABIT (131,072 x 8 BIT) 5 VOLT CMOS FLASH MEMORY Functional Description The S29C51001T/S29C51001B consists of 256 equally-sized sectors of 512 bytes each. The 8 KB lockable Boot Block is intended for storage of the system BIOS boot code. The boot code is the first piece of code executed each time the system is powered on or rebooted. The S29C51001 is available in two versions: the S29C51001T with the Boot Block address starting from 1E000H to 1FFFFH, and the S29C51001B with the Boot Block address starting from 00000H to 1FFFFH. S29C51001T 8KB Boot Block 512 512 * * * 1FFFFH 1E000H S29C51001B 512 512 * * * 512 512 01FFFH 512 00000H 00000H 512 8KB Boot Block 51001-13 Read Cycle A read cycle is performed by holding both CE and OE signals LOW. Data Out becomes valid only when these conditions are met. During a read cycle WE must be HIGH prior to CE and OE going LOW. WE must remain HIGH during the read operation for the read to complete (see Table 1). 8KB Boot Block = 16 Sectors Output Disable Returning OE or CE HIGH, whichever occurs first will terminate the read operation and place the l/O pins in the HIGH-Z state. During the byte program cycle, addresses are latched on the falling edge of either CE or WE, whichever is last. Data is latched on the rising edge of CE or WE, whichever is first. The byte program cycle can be CE controlled or WE controlled. Sector Erase Cycle The S29C51001T/S29C51001B features a sector erase operation which allows each sector to be erased and reprogrammed without affecting data stored in other sectors. Sector erase operation is initiated by using a specific six-bus-cycle sequence: Two unlock program cycles, a setup command, two additional unlock program cycles, and the sector erase command (see Table 2). A sector must be first erased before it can be reprogrammed. While in the internal erase mode, the device ignores any program attempt into the device. The internal erase completion can be determined via DATA polling or toggle bit. The S29C51001T/S29C51001B is shipped with pre-erased sectors (all bits = 1). Standby The device will enter standby mode when the CE signal is HIGH. The l/O pins are placed in the HIGH-Z, independent of the OE signal. Byte Program Cycle The S29C51001T/S29C51001B is programmed on a byte-by-byte basis. The byte program operation is initiated by using a specific four-buscycle sequence: two unlock program cycles, a program setup command and program data program cycles (see Table 2). Table 1. Operation Modes Decoding Decoding Mode Read Byte Write Standby Autoselect Device ID Autoselect Manufacture ID Enabling Boot Block Protection Lock CE VIL VIL VIH VIL VIL VIL OE VIL VIH X VIL VIL VH WE VIH VIL X VIH VIH VIL A0 A0 A0 X VIH VIL X A1 A1 A1 X VIL VIL X A9 A9 A9 X VH VH VH I/O READ PD HIGH-Z CODE CODE X S29C51001T/S29C51001B V1.0 February 2003 9 SyncMOS Technologies Inc. S29C51001T/S29C51001B 1 MEGABIT (131,072 x 8 BIT) 5 VOLT CMOS FLASH MEMORY Decoding Mode Disabling Boot Block Protection Lock Output Disable CE VH VIL OE VH VIH WE VIL VIH A0 X X A1 X X A9 VH X I/O X HIGH-Z NOTES: 1. X = Don't Care, VIH = HIGH, VIL = LOW. VH = 12.5V Max. 2. PD: The data at the byte address to be programmed. Table 2. Command Codes First Bus Program Cycle Command Sequence Read Read Autoselect Address XXXXH 5555H 5555H Data F0H AAH AAH 2AAAH 2AAAH 55H 55H 5555H 5555H F0H 90H RA 00H 01H RD 40H 01H(1) A1H(2) PD(4) Second Bus Program Cycle Address Data Third Bus Program Cycle Address Data Fourth Bus Program Cycle Address Data Fifth Bus Program Cycle Address Data Six Bus Program Cycle Address Data Byte Program Chip Erase 5555H AAH 2AAAH 55H 5555H A0H PA 5555H AAH AAH 2AAAH 2AAAH 55H 55H 5555H 5555H 80H 80H 5555H 5555H AAH AAH 2AAAH 2AAAH 55H 55H 5555H PA(3) 10H 30H Sector Erase 5555H NOTES: 1. Top Boot Sector 2. Bottom Boot Sector 3. PA: The address of the memory location to be programmed. 4. PD: The data at the byte address to be programmed. Chip Erase Cycle The S29C51001T/S29C51001B features a chiperase operation. The chip erase operation is initiated by using a specific six-bus-cycle sequence: two unlock program cycles, a setup command, two additional unlock program cycles, and the chip erase command (see Table 2). The chip erase operation is performed sequentially, one sector at a time. When the automated on chip erase algorithm is requested with the chip erase command sequence, the device automatically programs and verifies the entire memory array for an all zero pattern prior to erasure The automatic erase begins on the rising edge of the last WE or CE pulse in the command sequence and terminates when the data on DQ7 is "1". DATA Polling (I/O7) The S29C51001T/S29C51001B features DATA polling to indicate the end of a program cycle. When the device is in the program cycle, any attempt to read the device will received the complement of the loaded data on I/O7. Once the program cycle is completed, I/O7 will show true data, and the device is then ready for the next cycle. Toggle Bit (I/O6) The S29C51001T/S29C51001B also features another method for determining the end of a program cycle. When the device is in the program cycle, any attempt to read the device will result in l/O6 toggling between 1 and 0. Once the program is completed, the toggling will stop. The device is then ready for the next operation. Examining the toggle bit may begin at any time during a program cycle. Program Cycle Status Detection There are two methods for determining the state of the S29C51001T/S29C51001B during a program (erase/program) cycle: DATA Polling (I/O7) and Toggle Bit (I/O6). S29C51001T/S29C51001B V1.0 February 2003 10 SyncMOS Technologies Inc. S29C51001T/S29C51001B 1 MEGABIT (131,072 x 8 BIT) 5 VOLT CMOS FLASH MEMORY Boot Block Protection The S29C51001T/S29C51001B features hardware Boot Block Protection. The boot block sector protection is enabled when high voltage (12.5V) is applied to OE and A9 pins with CE pin LOW and WE pin lOW. The sector protection is desabled when high voltage is applied to OE, CE and A9 pins with WE pin LOW. Other pins can be HIGH or LOW. This is shown in table 1. Device ID In Autoselect mode, performing a read at address XXXXH will determine whether the device is a Top Boot Block device or a Bottom Boot Block device. If the data is 01H, the device is a Top Boot Block. If the data is A1H, the device is a Bottom Boot Block device (see Table 3). In addition, the device ID can also be read via the command register when the device is erased or programmed in a system without applying high voltage to the A9 pin. When A0 is HIGH, the device ID is presented at the outputs. Autoselect The S29C51001T/S29C51001B features an Autoselect mode to identify the Boot Block (protected/unprotected), the Device (Top/Bottom), and the manufacturer ID. To get to the Autoselect mode, a high voltage (VH) must be applied to the A9 pin. Once the A9 signal is returned to LOW or HIGH, the device will return to the previous mode. Manufacturer ID In Autoselect mode, performing a read at address. XXXX0H will determine the manufacturer ID. 40H is the manufacturer code for SyncMOS Flash. In addition the manufacturer ID can also be read via the command register when the device is erased or programmed in a system without applying high voltage to the A9 pin. when A0 is LOW, the manufacturer ID is presented at the outputs. Boot Block Protection Status In Autoselect mode, performing a read at address 3CXX2H or address 0CXX2H will indicate if the Top Boot Block sector or the Bottom Boot Block sector is locked out. If the data is 01H, the Top/Bottom Boot Block is protected. If the data is 00H, the Top/Bottom Boot Block is unprotected. (see Table 3.) Hardware Data Protection VCC Sense Protection: the program operation is inhibited when VCC is less than 2.5V. Noise Protection: a CE or WE pulse of less than 5ns will not initiate a program cycle. Program Inhibit Protection: holding any one of OE LOW, CE HIGH or WE HIGH inhibits a program cycle. Table 3. Autoselect Decoding Address Decoding Mode Boot Block Protection Boot Block Top Bottom A0 VIL VIL VIH A1 VIH VIH VIL A2-A13 X X X A14-A16 VIH VIL X Data I/O0-I/O7 01H: protected 00H: unprotected 01H A1H Device ID Top Bottom Manufacture ID NOTE: 1. X = Don't Care, VIH = HIGH, VIL = LOW. VIL VIL X X 40H S29C51001T/S29C51001B V1.0 February 2003 11 SyncMOS Technologies Inc. S29C51001T/S29C51001B 1 MEGABIT (131,072 x 8 BIT) 5 VOLT CMOS FLASH MEMORY Byte Program Algorithm Write Program Command Sequence Chip/Sector Erase Algorithm Write Erase Command Sequence Add/Data 5555H/AAH Add/Data 5555H/AAH 2AAAH/55H Four Bus Cycle Sequence 5555H/A0H 2AAAH/55H 5555H/80H Six Bus Cycle Sequence PA/PD 5555H/AAH DATA Polling (I/O7) or Toggle Bit (I/O6) 2AAAH/55H No Verify Byte? 5555H/10H (Chip Erase) PA/30H (Sector Erase Yes Programming Completed DATA Polling or Toggle Bit Successfully Completed Erase Complete 51001-14 S29C51001T/S29C51001B V1.0 February 2003 12 SyncMOS Technologies Inc. S29C51001T/S29C51001B 1 MEGABIT (131,072 x 8 BIT) 5 VOLT CMOS FLASH MEMORY DATA Polling Algorithm Read I/O7 Address = PBA(1) Toggle Bit Algorithm Read I/O6 No I/O7 = Data Read I/O6 Yes Yes Program Done No I/O6 Toggle Program Done 51002-17 NOTE: 1. PBA: The byte address to be programmed. S29C51001T/S29C51001B V1.0 February 2003 13 SyncMOS Technologies Inc. S29C51001T/S29C51001B 1 MEGABIT (131,072 x 8 BIT) 5 VOLT CMOS FLASH MEMORY Package Diagrams 32-pin Plastic DIP 1.660 MAX. 15 MAX INDEX-1 EJECTOR MARK 0.545/0.555 INDEX-2 .600 TYP +.004 .010 - .0004 .050 MAX 0.210 MAX 0.120 MIN .100 TYP +.012 .047 - 0 +.006 .018 - .002 0.010 MIN .032 +.012 -0 32-pin PLCC 20 19 18 21 22 23 24 25 26 27 28 29 30 31 32 1 2 3 4 17 16 15 14 13 12 11 10 9 8 7 6 5 .550 .003 .590 .005 .045X45 .450 .003 .490 .005 .050 TYP .110 .136 .003 .046 .003 .025 30 .017 3 - 6 .420 .003 3 - 6 3 - 6 S29C51001T/S29C51001B V1.0 February 2003 14 SyncMOS Technologies Inc. S29C51001T/S29C51001B 1 MEGABIT (131,072 x 8 BIT) 5 VOLT CMOS FLASH MEMORY 32-pin TSOP-I Units in inches 0.787 0.008 Detail "A" 0.010 0.315 TYP. (0.319 MAX.) 0.024 0.004 0.724 TYP. (0.728 MAX.) SEATING PLANE See Detail "A" 0.005 MIN. 0.007 MAX. 0.032 TYP. 0.020 MAX. 0.020 SBC 0.003 MAX 0.009 0.002 0.035 0.002 0.047 MAX. S29C51001T/S29C51001B V1.0 February 2003 15 SyncMOS Technologies Inc. S29C51001T/S29C51001B 1 MEGABIT (131,072 x 8 BIT) 5 VOLT CMOS FLASH MEMORY Sales Office : No. 1, Creation Rd. 1, Science-Based Industrial Park, Hsinchu, Taiwan, R.O.C. Tel : 886-3-5792926 Fax : 886-3-5792953 Note 1 : publication date : May 1999. Rev. A Note 2 : all data and specification are subject to change without notice. 16 S29C51001T/S29C51001B V1.0 February 2003 |
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